Tescan proudly introduces the second generation of Mira family of high performance scanning electron microscopes equipped with a Schottky Field Emission gun.
The Most Important Features of MIRA II:
- High brightness Schottky emitter for high-resolution / high-current / low-noise imaging.
- Extraordinary resolution with powerful In-Beam Technology, especially at low accelerating voltages.
- Unique three-lens Wide Field Optics™ design offering the variety of working and displaying modes embodying the Tescan proprietary Intermediate Lens for the beam aperture optimisation.
- Real time In-Flight Beam Tracing™ for the performance and spot optimisation integrating the well established software Electron Optical Design.
- Optional Active Vibration Isolation is fully integrated in the microscope frame for efficient cancelling of ambient vibration.
- Fast imaging rate with Tescan's first class YAG-based detectors.
- High-throughput large-area automation, e.g. automated particle location and analyses with fully motorized compucentric stages.
- Fully automated microscope set-up including electron optics set-up and alignment.
- Sophisticated software for SEM control, image acquisition, archiving, processing and analysis. Multiuser environment is localized in many languages.
- Network operations and built-in remote access/diagnostics, all come as the Tescan standard.
- Unique live stereoscopic imaging utilizing the 3D Beam Technology.
MIRA II Models
The MIRA II comes in two main variants:
 |  |
| Extraordinary FE-SEM with In-Beam SE Detector.
|
A compact solution of the high resolution FE-SEM.
|
|
