Index - czech / english / deutch
News and Events
News

Upcoming Events and Exhibitions

LYRA\ FIB-SEM

LYRA I FIB-SEM

(Oct 2007)
Tescan introduces a new series of LYRA I FIB-SEM, a fully integrated system of scanning electron microscope and focused ion beam

more...


MIRA II FE SEM

MIRA II High-Resolution Schottky FE-SEM
(Jun 2007)
Tescan proudly introduces a new generation of MIRA, a series of Schottky field emission scanning electron microscopes. It is equipped with a powerfull In-Beam Technology.

more...


Wide Field Optics

Wide Field Optics™

Feb/2007

Tescan anounces a new Wide Field scanning mode for extra low magnification nondistorted imaging and a revolutionary Live Stereo Imaging using the Wide Field Optics.

more...


New Retractable BSE Detector

Příklad

  • Excellent imaging with super clarity
  • High lateral as well as atomic number resolution
  • Optimised lightguide design for high efficiency
  • Modern shape and appearance

SEM + 3D Measurements

Last year, the company Tescan launched the co-operation with the company Alicona. The result of this co-operation is interconnection of the microscope Vega with the Alicona software MeX that allows capturing stereoscopic images of the investigated surface.

The software MeX is able to do remote control of the Vega 3D Beam technology and its images analysis is the base for calculating and imaging 3D model of the surface. Digital model of the surface is intended for measuring profiles, roughness values, area parameters and even volumes of specimen from SEM images.

SEM images

WhenWhatWhereWebContact
June 23rd - 26th 2008MICROSCIENCE 2008ExCel, London, UKinfolinkTescan, s.r.o.
September 1st - 5th 2008EMC 2008 - 14th European Microscopy CongressAachen, GermanyinfolinkTescan, s.r.o.
September 23rd - 25th 2008ANALYTICA ChinaShanghai, ChinainfolinkTescan, s.r.o.
October 7th - 9th 2008SEMICON Europa 2008Stuttgart, GermanyinfolinkTescan, s.r.o.
November 2nd - 7th 2008APMC9 - 9th Asia-Pacific Microscopy ConferenceJeju Island, KoreainfolinkTescan, s.r.o.