TESCAN
TESCAN
TESCAN
TESCAN
TESCAN
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News

TESCAN Introduces the new GAIA3 FIB-SEM workstation

04/09/2014 | TESCAN, a leading provider of charged particle technology and FIB-SEM integrated analytical solutions will introduce the new GAIA3 FIB-SEM workstat Read more

Analytical workshop brought WDS experts to Brno

25/06/2014 | TESCAN in cooperation with Thermo Scientific hosted a successful analytical workshop in Brno focused on elemental mapping. Read more

New subsidiary - TESCAN ORSAY FRANCE

01/06/2014 | TESCAN ORSAY HOLDING has been expanding manufacturing capacities as well as sales network, which has recently resulted in establishing TESCAN UK, i Read more

Application examples

Many efforts have been made in the last decades to obtain nanomaterials with the determined structure and functionality,using nanoscience knowledge and various nanotechnologies.

Product Focus

TESCAN

The world’s first fully integrated Xe plasma source FIB with SEM enables extremely high ion currents up to 2 μA thus increasing sputtering rate more than 50 times compared to conventional Ga source. This predetermines FERA3 for milling big volumes of materials that were time consuming or impossible so far.

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