Chalmers Microscopy School 2016

Oct/25/2016 to Oct/27/2016 Gothenburg (Göteborg), Sweden
Enter website
The three-day course held at Chalmers University of Technology will focus on basic principles in scanning electron microscopy and microanalysis.
The course will cover instrumentation and techniques for imaging and analysis under different vacuum conditions, and at high as well as low acceleration voltages. The lectures in the morning sessions will give a background to the afternoon laboratory sessions carried out on SEMs with surrounding interactive equipment for chemical and structural analysis. Top-of-the-line instrumentation will be brought to Chalmers by the participating companies. Come and meet fellow microscopists and company representatives for interesting discussions!

TESCAN will be represented by MIRA3 FE-SEM.

Related Events

ESREF 2016
Sep/19/2016 to Sep/22/2016
Händel-Halle, Halle (Saale)
SIMS Europe 2016
Sep/21/2016 to Sep/24/2016
Brno
MS&T16
Oct/23/2016 to Oct/27/2016
Salt Palace Convention Center, Salt Lake City, Utah, USA
ISTFA 2016
Nov/06/2016 to Nov/10/2016
Fort Worth Convention Center, Fort Worth, Texas, USA