Chalmers Microscopy School 2016

Oct/25/2016 to Oct/27/2016 Gothenburg (Göteborg), Sweden
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The three-day course held at Chalmers University of Technology will focus on basic principles in scanning electron microscopy and microanalysis.
The course will cover instrumentation and techniques for imaging and analysis under different vacuum conditions, and at high as well as low acceleration voltages. The lectures in the morning sessions will give a background to the afternoon laboratory sessions carried out on SEMs with surrounding interactive equipment for chemical and structural analysis. Top-of-the-line instrumentation will be brought to Chalmers by the participating companies. Come and meet fellow microscopists and company representatives for interesting discussions!

TESCAN will be represented by MIRA3 FE-SEM.

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