Steels & Metal Alloys
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Q-PHASE: Quantitative, label-free imaging cytometry
TIMA-X TESCAN Integrated Mineral Analyser
TESCAN SEM/FIB-SEM with integrated Raman spectrometry
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Low Vacuum Secondary Electron TESCAN Detector
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are of great benefit to the glass industry. Glass and its derived products are an important part of automotive, construction, engineering and energy industry, among others.
Glass-based materials are often sensitive to being exposed to high voltage electron beams. However, glass samples can be suitably observed with the
TESCAN MAIA3 FEG-SEM
, which provides an excellent resolution imaging even at low accelerating landing energies. In addition, UniVac is a variable pressure mode which allows the user to observe samples that cannot be sputter coated with metals. Products made of flat glass can be seen in our daily life in the form of windscreens, glass windows, solar panels, furniture parts, electronics, or in the form of containers such as a bottles, jars, etc.
are materials consisting of extremely fine filaments glass that are connected in a compact form. Such fibres have good thermal and acoustical properties and are therefore commonly used in home insulation.
Advanced glasses such as oxide, silicates, phosphates and borosilicates have good resistance to thermal shock, a variety of special optical properties as well as good chemical resistance. These materials are widely used in industry and their use in optical fibres is one example of their many applications.
Inclusion in glass
Related Application Notes
LE - BSE
Imaging of non-conductive samples, detecting nuances of compositional contrast or resolving tiny surface features in many fields of life science, material science or semiconductor engineering have become increasingly more important for scanning electron microscopy. For high energy beam the penetration depth of the electron beam interacting with the sample surface is high, resulting in a large interaction volume. Modern materials such as very thin composites in nano-meter scale cannot be observed at high energies because surface features are simply transparent for the electron beam. .
pdf – 3.3 MB
Download : LE - BSE
FIB milling of non-conductive samples
Using FIB on non-conductive samples is a challenging task, because of charging. The charging can affect the beam positioning in an unexpected way. On some materials a periodical drift correction is sufficient, on others, some kind of charge compensation has to be used. The electron beam from the SEM or an electron flood gun are used as an effective charge compensation tool.
pdf – 890 kB
Download : FIB milling of non-conductive samples
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