History

History and Present

Founded as a small company for manufacturing programmable control units for general purposes, upgrading analogue scanning electron microscopes and manufacturing accessories for them in 1991, the TESCAN is today one of the global suppliers of scanning electron microscopes and solutions for materials science, industry, biology and life sciences, forensic science and others.

History of TESCAN

2012

  • CEO Jaroslav Klima named Entrepreneur of the Year 2011 in the South Moravian Region and Technology Entrepreneur of the Year 2011 in the Czech Republic

2011

2010

  • Introduction of third generation of SEMs
  • Transformation to a joint stock company
  • Acquisition of Tescan USA
  • General Manager Jaroslav Klima named Entrepreneur of the Year 2009 in the South Moravian Region

2009

  • Establishing a branch office in China (TESCAN China)
  • INDUSEM introduced - a scanning electron microscope for industrial use

2008

  • LYRA I FEG introduced
  • Introduced VEGA II EasyProbe, an EasySEM™ with a fully integrated One-Touch EDX

2007

  • LYRA I FIB-SEM introduced
  • MIRA II Schottky FE-SEM with In-Beam Detector
  • World’s first live stereoscopic SEM imaging

2006

  • VEGA II 3D Metrology

2005

  • MIRA I Schottky FE-SEM
  • In-Flight Beam Tracing™ technology for MIRA introduced

2004

  • VEGA II SEM - second generation with 8 standard models
  • Released Wide Field Optics™ unique electron-optical design
  • ISO 14001, 9001 Quality Certification

2003

  • LVSTD – the Low Vacuum Secondary Electron Detector – patented

2002

  • Large chamber models for VEGA SEM released

2001

  • Gold medal for VEGA TS 5130 MM on 43rd International Engineering Fair
  • Award of the Engineering Academy of the Czech Republic

2000

  • Variable Pressure VEGA SEM introduced

1999

  • VEGA SEM with built-in remote control introduced

1996

  • First compact fully PC controlled SEM PROXIMA introduced

1992

  • Image processor “Satellite” for upgrading older SEMs to digital image acquisition

1991

  • TESCAN, s.r.o. established

Product Focus

TIMA-product_focus

The TESCAN Integrated Mineral Analyzer. TIMA, a fully automated, high throughput, analytical scanning electron microscope is designed specifically for the mining and minerals processing industry. The TIMA solution will address applications such as Mineral Liberation Analysis,TESCAN, a world leading manufacturer of scanning electron microscopes and focused ion beam workstations has introduced the TESCAN Integrated Mineral Analyzer.

Products List

Regional distributors