TESCAN, a leading global supplier of scanning electron microscopes and focused ion beam workstations has undergone a restructuring of the company formation following a merger with French Ion and Electron Beam technology company Orsay Physics.
The Electron Beam Induced Current (EBIC) Detector is used for the detection of current generated by an electron beam. The TESCAN EBIC detector has recently been upgraded. The current can be measured at a point (quantitative EBIC) or it can be used for fast modulation of imaging signal for scanning beam to create a 2D map of an active region.
Institute of Photonics and Electronics (ÚFE) in collaboration with scientists from TESCAN presented at 19th International Conference on Secondary Ion Mass Spectrometry (SIMS-19) in Korean Jeju scientific poster concerning Imaging of Dopant Distribution in Optical Fibers with an Orthogonal TOF-SIMS.
Competing with 209 companies from South Moravia Region, TESCAN came very closely second after the winning company. Since equal score was reached by two top companies, the final ranking was decided by the jury consisting of representatives of competition partners.
Poster presenting the results of Cyclic Plasticity and Strain Localization research was awarded as the best one during the Intermetallics Conference held from 30 September to 4 October 2013 in Kloster Banz, Germany. The authors of the poster are researchers from TESCAN and from the Institute of Physics of Materials, Academy of Sciences of the Czech Republic.