31/03/2014

TESCAN, a renowned brand of scanning electron microscopes and focused ion beam systems and Oxford Instruments introduces an innovative solution for 3D EDS and 3D EBSD using a static acquisition geometry! 

TESCAN’s team invites the visitors of analytica 2014 to join us for live demonstrations of a LYRA3 FIB-SEM equipped with 3D EDS and 3D EBSD systems by Oxford Instruments at booth 522 in Hall A2 in Munich. 

25/03/2014

Press release 25/03/2014

TESCAN ORSAY HOLDING, a.s., a multinational company experienced in charged particle optics, and WITec GmbH, a distinguished German specialist in Raman and scanning probe microscopy, jointly launch RISE Microscopy at Analytica 2014.

12/03/2014

TESCAN proudly introduces New Retractable STEM Detector "R-STEM Detector"

The retractable STEM detector (R-STEM) is a new version of the STEM detector in addition to the fixed STEM detector version. The detector is designed with the respect to broad application range of the STEM in SEM/FIB-SEM.

13/12/2013

TESCAN, a leading global supplier of scanning electron microscopes and focused ion beam workstations has undergone a restructuring of the company formation following a merger with French Ion and Electron Beam technology company Orsay Physics.

09/12/2013

The Electron Beam Induced Current (EBIC) Detector is used for the detection of current generated by an electron beam. The TESCAN EBIC detector has recently been upgraded. The current can be measured at a point (quantitative EBIC) or it can be used for fast modulation of imaging signal for scanning beam to create a 2D map of an active region.

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The world’s first fully integrated Xe plasma source FIB with SEM enables extremely high ion currents up to 2 μA thus increasing sputtering rate more than 50 times compared to conventional Ga source. This predetermines FERA3 for milling big volumes of materials that were time consuming or impossible so far.

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