Evaluation of principal characteristics of cell morphology and cell mass is possible even in Q-PHASE control software.

TESCAN, a leading world manufacturer of charge particle technology, has appointed Dr. Michal Rabara as President & CEO of TESCAN USA Inc. with effect from January 1st 2016.

TESCAN is proud to announce the release of a new detector, the High Angle Dark Field Retractable STEM Detector (HADF R-STEM). This detector offers all the capabilities of the standard fixed TESCAN STEM detector with the extra advantage of retractability and the acquisition of HADF signal.

TESCAN announce its continued expansion worldwide with the launch of a new subsidiary in Brazil.

Presentation of comparison of Xe and Ga FIB effect on lateral damage of TEM samples and illustration of clear ways to keep this damage minimized at 41st International Symposium for Testing and Failure Analysis (ISTFA).

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