The creation of favorable conditions for the complex analysis of specimens, together with the possibility of high-quality images of the specimen surface for morphological studies, was a high priority in the design of TESCAN microscopes from the beginning of their development.
Transmission electron microscopy is widely used in the field of Life Science or Material Engineering. Therefore TESCAN has developed an adaptor that provides a complementary method for image acquisition of the transmitted electrons - scanning transmission electron microscopy detector (STEM).
High efficiency SE detector is placed in the objective lens.
A cathodoluminescence detector attached to a TESCAN Scanning Electron Microscope (SEM) is capable of producing high-resolution digital cathodoluminescent (CL) images of luminescent materials.
The Low Vacuum Secondary Electron TESCAN Detector is a unique solution developed and patented by TESCAN. A modified Everhart-Thornley design equipped with a YAG scintillator provides a lots of merits.
TESCAN offers a SEM Control Panel as another option to the standard controllers like multipurpose trackball or EasySEM™ touch screen control interface. The Control Panel is designed to fully control the microscope without need to use another controlling device. Moreover, the user can work in the fullscreen image mode and operate all imaging functions simultaneously.
Nanorobotics Manipulators are optional accessory expanding the TESCAN FIB and SEMs to a material processing and analytical Workbench.