History and Current Status

Founded as a small company for manufacturing programmable control units for general purposes, upgrading analogue scanning electron microscopes and manufacturing accessories for them in 1991, the TESCAN company today belongs to global suppliers of scanning electron microscopes and solutions for material science, industry, biology and life sciences, forensic science and others.

History of TESCAN’s Success

2010

• Introduction of third generation of SEMs
• Transformation to a joint stock company
  

2009 

• Introduced INDUSEM - a scanning electron microscope for industrial use
  

2008

• LYRA I FEG introduced
• Introduced VEGA II EasyProbe, an EasySEM™ with a fully integrated One-Touch EDX
  

2007

• LYRA I FIB-SEM introduced
  
• MIRA II Schottky FE-SEM with In-Beam Detector
  
• World’s first live stereoscopic SEM imaging
  

2006

• VEGA II 3D Metrology
  

2005

• MIRA I Schottky FE-SEM
  
• In-Flight Beam Tracing™ technology for MIRA introduced

2004

• VEGA II SEM - second generation with 8 standard models
  
• Released Wide Field Optics™ unique electron-optical design
  
• ISO 14001, 9001 Quality Certification
  

2003

• Patented LVSTD – the Low Vacuum Secondary Electron Detector
  

2002

• Large chamber models for VEGA SEM released
  

2001

• Gold medal for VEGA TS 5130 MM on 43rd International Engineering Fair
  

2000

• Variable Pressure VEGA SEM introduced
  

1999

• VEGA SEM with built-in remote control introduced
  

1996

• First compact fully PC controlled SEM PROXIMA introduced
  

1992

• Image processor “Satellite” for upgrading older SEMs to digital image acquisition
  

1991

• TESCAN, s.r.o. established