Third generation of TESCAN scanning electron microscopes

« back | 04/12/10

Tescan announces launch of new generation of all models

Third generation of TESCAN microscopes cumulates nearly 20 years of experience from research, development and manufacturing of scanning electron microscopes, supplementary accessories for SEMs and other special products. Within portfolio of TESCAN products there are scanning electron microscopes with tungsten filament VEGA, high resolution Schottky emitter scanning electron microscopes MIRA, focused ion beam scanning electron microscopes based on tungsten VELA and focused ion beam scanning electron microscopes based on field emission LYRA.
New, modern high-performance electronics allows faster acquiring and processing of high quality and high resolution images and thus decreasing time needed to obtain image. Unique TESCAN real time In-Flight Beam Tracing™ for the beam optimization is now available for both field emission and also thermal emission columns.
Note: Selected models of previous generation are available on request until the end of 2010.

Product focus

Let the SEM Work for You
The INDUSEM is a new model of a scanning electron microscope intended for industrial applications. This system is compact, based on a robust and transportable frame. The extra large chamber and low vacuum system enables investigation of wide sample range and makes INDUSEM an ideal system for e.g. quality control and failure analysis within a production plant.
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