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78th Annual Meeting of the Japanese Society of Microscopy

78th Annual Meeting of the Japanese Society of Microscopy

Image Source: https://conference.wdc-jp.com/

We were excited to attend the 78th Annual Meeting of the Japanese Society of Microscopy from 11 to 13 May 2022 in Koriyama, Japan. Our Japanese partner, TOYO Corporation, and Area Sales Manager, Antonín Doupal, demonstrated our FIB-SEM and micro-CT solutions, including a technical presentation on the TESCAN Rocking Stage – the most efficient method for achieving artifact-free FIB cross-sections.
You can learn more about it here.

Our Japanese distributor, TOYO Corporation, and Area Sales Manager, Antonín Doupal at the meeting.
16.05.2022