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TESCAN MAGNA

UHR SEM for nanomaterials characterization at sub-nanometer scale

  • High-resolution and high-contrast imaging of nextgen materials (e.g. catalyst structures, nanotubes, nanoparticles and other nanoscale structures)
  • Excellent platform suitable for SEM/STEM metrology at sub-nanometer scale
  • Fast setup of the electron beam – optimal imaging conditions are guaranteed by the In-Flight Beam Tracing™

  • Multi-detector system TriBE™ and TriSE™ for sample nanocharacterization
  • Intuitive software modular platform designed for effortless operation regardless users’ skill level
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