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TESCAN AMBER

Versatile nanoanalytical FIB-SEM to expand your materials research capabilities

  • High precision micro sample preparation
  • Ultra-high resolution field-free SEM imaging and nanoanalysis
  • Extended field of view and easy navigation
  • Multi-site process automation

  • Multi-modal FIB-SEM tomography
  • Easy-to-use modular software user interface
  • Attractive optional packages for various applications
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