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TESCAN AMBER X | New Plasma FIB Field-Free UHR FE-SEM

A unique combination of plasma FIB and field-free UHR FE-SEM for the widest range of materials characterization applications.

TESCAN AMBER X | New Plasma FIB Field-Free UHR FE-SEM

TESCAN AMBER X

TESCAN AMBER X

As the first SEM manufacturer to commercialize integrated xenon plasma FIB with the SEM, TESCAN proudly announces TESCAN AMBER X.

TESCAN AMBER X is a new FIB-SEM solution that combines high throughput plasma-assisted ion milling with improved ultra-high resolution (UHR) field-free SEM optics, a combination ideally suited for materials characterization over a significantly wider sample range. TESCAN AMBER X target applications include milling and characterization of large cross-sections (up to 1 mm in width), multiscale, multi-modal FIB-SEM tomography, and contamination-free preparation of micro- and nano-structures for subsequent testing or characterization.

Full Press Release

02.09.2019