Chalmers Microscopy School 2018

Oct/23/2018 to Oct/25/2018 Göteborg, Sweden
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Take the chance to learn about new developments in focused ion beam and scanning electron microscopy.
The three-day course SEM 2018 will focus on advanced techniques in imaging and microanalysis.  X-ray mapping with particle analysis and the theory and application of electron backscatter diffraction (EBSD) and transmission Kikuchi diffraction (TKD) will be covered. The acquisition and use of different types of images and maps in 3D reconstruction of materials microstructures will also be discussed.  SEM 2018 will combine theory and practical experience. The lectures in the morning sessions will give a background to the afternoon laboratory sessions. Bring your own specimens to the Open Lab evening sessions.

TESCAN Instruments will be represesented by GAIA3.