IMC19 - International Microscopy Conference

Sep/09/2018 to Sep/14/2018 Sydney, Australia
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TESCAN is happy to be an exhibitor at 19th International Microscopy Congress (IMC19) which is held from 9-14 September 2018 in International Convention Centre Sydney (ICC Sydney). We are pleased to welcome you to visit our booth 24 – 28.
 

BOOK YOUR DEMO NOW!

TESCAN IMC GENERAL FLYER

LUNCH & LEARNS

FEATURED INSTRUMENTS

AFTERNOON TUTORIALS

DIGITAL POSTERS PRESENTATIONS

Applications of New FIB-SEMs


DEMO BOOKING

There are 60 minutes demo slots available from Monday 10/09/2018 till Friday 14/09/2018. Please, give us an indication of your demo time preference. Demo time slot availability will be confirmed by email.
This message is routed directly to our staff attending the stand at the IMC 2018. Please, let us know any particular questions you may have during the demo so we can address them and perhaps to start a discussion on the topic of your choice before the exhibition.

 
Your personal data will be processed according to the privacy policy.


LUNCH & LEARNS

Enjoy our Lunch & Learn session with exciting topics, a free buffet is also provided giving you the perfect opportunity to network with other attendees and the TESCAN team. Everyday at 11:30.

 

Your personal data will be processed according to the privacy policy.


AFTERNOON TUTORIALS

If you want to see introduction and applications examples of new TESCAN FIB-SEM S9000X, register yourself for everyday afternoon tutorial.

 

Your personal data will be processed according to the privacy policy.


FEATURED INSTRUMENTS

 

Visit Delmic booth 47 - 50 and experience S8000 GMU with Delmic detectors showing High-performance SEM cathodoluminescence imaging

Registration for a demo at Delmic booth


 


DIGITAL POSTERS PRESENTATIONS


We also invite you to our digital posters presentation, meet our specialists and find out what’s new! Posters will be available to view on smartphones, tablets and interactive kiosks in the exhibition hall throughout the Congress, with scheduled 30 minute time slots alongside concurrent sessions for authors wishing to stand by their poster.

Wednesday September 12

11:30 Samuel Záchej
Digital kiosk 3
„New Generation Ultra-High Resolution SEM Equipped with a New Xe Plasma FIB for Ultra-Fast and Gentle Sputtering“
15:00 Jaroslav Jiruše
Digital kiosk 2
„Detection Capabilities of Ultra-High-Resolution Scanning Electron Microscopes“

Thursday September 13

10:30 Samuel Záchej
Digital kiosk 6
„Semi-automated FIB Sample Preparation Workflow for Cryo-TEM“