News

Redefining large-area FIB cross-sectioning with the new TESCAN S8000X plasma FIB-SEM
Physical Failure Analysis in a MEMS motion sensor: 1 mm-wide cross-section
Dec/10/2018
Nov/30/2018
FIB-SEM Tomography of Biological Specimens with the new TESCAN S9000G
Advanced Focused Ion Beam-Scanning Electron Microscopy for 3D ultrastructural...
Nov/29/2018
Nanostructured composite analysis in automotive industry with TESCAN instruments
Nanocomposite Kaolin/TiO2 as a Possible Functional Filler in Automotive Brake...
Nov/23/2018
Advanced preparation of ultra-thin TEM specimens with the new TESCAN S9000G FIB-SEM
Ga FIB TEM sample preparation from a 10 nm FinFET device
Nov/19/2018
Comparative study of plasmonic antennas
Fabrication of plasmonic structures by electron beam lithography using the...
Nov/01/2018
Studying the ultrastructure of wood with TESCAN LYRA3 FIB-SEM
FIB-SEM tomography of spiral thickening in wood
Oct/11/2018
Morphological characterization of nanostructures with the TESCAN MIRA3 FEG-SEM
Nanoparticles imaged with the TESCAN MIRA3 at 10 kV and up to 1,000,000...
Sep/13/2018
Sep/04/2018
TESCAN S9000X - webinar
TESCAN has successfully launched its new TESCAN S9000X plasma FIB-SEM system...
Aug/27/2018

Tescan websites

www.tescan-orsay.com
Multi-national company established by the merger of the Czech company TESCAN and the French company ORSAY PHYSICS.
library.tescan.com
TESCAN scientific knowledge base
www.sem-applications.com
Have a look into our gallery full of real applications and (not only) colored images
q-phase.tescan.com
Q-PHASE for quantitative phase imaging (QPI)

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