TESCAN S8000G for physical failure analysis of semiconductor devices
The application example for Dual Beam is named "Large-area Cross...
New TESCAN S8000 FEG-SEM for failure analysis in semiconductors
The application example for Single Beam is named "SEM inspection of ICs...
New TESCAN S8000G FIB-SEM for Au nanoparticle characterisation
The application example for Dual Beam is named "TEM specimen preparation...
Successful workshop in Jönköping
TESCAN distributor in Scandinavia NordicNano Solution AB & prestigious...
Because everything needs to be just right
SAFINA, a.s. a company located right at the heart of Europe has developed...
TESCAN at the MMC 2017
We would like to extend our thanks to all customers and business partners...
Understanding variability of metal additive parts
TESCAN Ga FIB-SEM LYRA3 used for preparation of electron-transparent TEM...
TESCAN presence in the South-East Asian high-tech
TESCAN GAIA in Fabrinet – A Trusted Manufacturing Partner of the World...
Workshop on Field emission scanning electron microscopy-based lithography
Jointly organized by the Advanced Instrumentation Research Facility at...
TESCAN FEG SEM MIRA3 LMU for elemental EDS characterisation of silver powder
Silver Nanoparticles Obtained by Semicontinuous Chemical Reduction Using...
A step ahead in FIB-SEM sample preparation – a new microscope from TESCAN
Anticipating the future, expanding your possibilities today

Tescan websites
Multi-national company established by the merger of the Czech company TESCAN and the French company ORSAY PHYSICS.
TESCAN scientific knowledge base
Have a look into our gallery full of real applications and (not only) colored images
Q-PHASE for quantitative phase imaging (QPI)

Contact us

Stay in touch! Do not hesitate to contact us with any question
Contact us

Subscribe to our newsletter

Do you want to receive latest news from TESCAN? Please subscribe to our newsletter