News

TESCAN S8000G for physical failure analysis of semiconductor devices
The application example for Dual Beam is named "Large-area Cross...
Jan/18/2018
New TESCAN S8000 FEG-SEM for failure analysis in semiconductors
The application example for Single Beam is named "SEM inspection of ICs...
Jan/11/2018
New TESCAN S8000G FIB-SEM for Au nanoparticle characterisation
The application example for Dual Beam is named "TEM specimen preparation...
Jan/05/2018
Successful workshop in Jönköping
TESCAN distributor in Scandinavia NordicNano Solution AB & prestigious...
Dec/19/2017
Because everything needs to be just right
SAFINA, a.s. a company located right at the heart of Europe has developed...
Jul/26/2017
TESCAN at the MMC 2017
We would like to extend our thanks to all customers and business partners...
Jul/11/2017
Understanding variability of metal additive parts
TESCAN Ga FIB-SEM LYRA3 used for preparation of electron-transparent TEM...
Jun/16/2017
TESCAN presence in the South-East Asian high-tech
TESCAN GAIA in Fabrinet – A Trusted Manufacturing Partner of the World...
Jun/09/2017
Workshop on Field emission scanning electron microscopy-based lithography
Jointly organized by the Advanced Instrumentation Research Facility at...
Jun/06/2017
TESCAN FEG SEM MIRA3 LMU for elemental EDS characterisation of silver powder
Silver Nanoparticles Obtained by Semicontinuous Chemical Reduction Using...
Jun/05/2017
A step ahead in FIB-SEM sample preparation – a new microscope from TESCAN
Anticipating the future, expanding your possibilities today
Jun/03/2017

Tescan websites

www.tescan-orsay.com
Multi-national company established by the merger of the Czech company TESCAN and the French company ORSAY PHYSICS.
library.tescan.com
TESCAN scientific knowledge base
www.sem-applications.com
Have a look into our gallery full of real applications and (not only) colored images
q-phase.tescan.com
Q-PHASE for quantitative phase imaging (QPI)

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