A step ahead in FIB-SEM sample preparation – a new microscope from TESCAN

Jun/03/2017
Anticipating the future, expanding your possibilities today
TESCAN is pleased to announce the launch of the first member of a new family of microscopes, a focused ion beam scanning electron microscope (FIB-SEM) that raises the bar on quality and throughput of high-end FIB-SEM applications such as sample preparation and microanalysis.

This new microscope has all that it takes to meet the demands of today’s research in both the academia and industry.  It achieves field-free ultra-high resolution imaging and it is equipped with a robust in-beam detection system with angle-selective and energy-filtering capabilities. These features allow resolving nano-sized features of your samples whether they are organic, inorganic, conductive, non-conductive, magnetic, or non-magnetic. In addition, this dual beam system features a novel FIB column, the next generation of Ga source FIB column and a guarantee of world-class quality in sample preparation with the highest throughput.

No need to say more, results speak for themselves. It is why we want to introduce this new microscope by inviting you to join a webinar in which our experts will present in detail all the features, and more importantly, will demonstrate what this instrument is capable of. Participate and find out how this complex yet easy-to-learn instrument works and suits your particular analytical needs. Our team of experts will be happy to answer all related questions you may have.



Because your attendance is valuable for us, the webinar has been planned for your convenience in two different times: at 9:00 CEST on Monday July 10, 2017, and, 17:00 CEST on Monday July 10 2017. The webinar – with duration of 15 minutes – will be followed by a 15-minutes Q&A session.

WEBINAR REGISTRATIONS ARE CLOSED NOW.



 

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