Analysis of ceramic nano-particles

Aug/21/2019
The new TESCAN CLARA field-free Ultra-High Resolution Scanning Electron Microscope (UHR-SEM) equipped by Brightbeam technology provides high resolution at low accelerating voltages.

This capability brings a high potential to the observation of the beam sensitive or charging samples. The high throughput is needed for the observation of the charging particles without a conductive coating layer. The low accelerating voltages help to reveal the very fine details of the surface structure.

One group of the samples that meets the previously mentioned requirements are the ceramic’s particles. The TESCAN CLARA provides high throughput for high-resolution imaging at high magnification.

Would you like to know more information? Download our Application Note.

Application Note

Analysis of ceramic nano-particles
pdf – 1.2 MB

The particles of sodium nitrate crystals synthesized by hydrothermal treatment of titanium substrate in sodium hydroxide solution under nitrogen
The particles of sodium nitrate crystals synthesized by hydrothermal treatment of titanium substrate in sodium hydroxide solution under nitrogen