Imaging nanocrystalline diamond with the new TESCAN S8000 microscope

Apr/23/2018
Surface characterisation of nanocrystalline diamonds
Nanocrystalline diamond is a solid film of nano-sized diamond particles which are grown by chemical vapor deposition on substrates such as silicon wafers. The nanocrystalline diamonds preserve the extreme properties of diamond such as hardness but at substantially lower costs. Their hardness, toughness and surface stability are important properties of these structures which make them suitable for diverse applications in nanotechnology, reasons for which it is important to make progress in their characterization.
 
The new TESCAN S8000 equipped with the BrightBeam™ SEM col­umn for UHR field-free imaging achieves excel­lent performance especially at low beam energies and provides excellent image contrast, high spatial res­olution and surface sensitivity essential to resolve nano-sized structures and characterize nanocrystalline diamonds.

Do you want to find out more? Please download the Application Example from the link below.

Fault planes and complex geometries of individual particles in nanocrystalline diamonds on Si substrate acquired at 2 keV with the four detectors Multidetector (left), Axial detector (center), E-T detector (right).
Fault planes and complex geometries of individual particles in nanocrystalline diamonds on Si substrate acquired at 2 keV with the four detectors Multidetector (left), Axial detector (center), E-T detector (right).

Application Example

Surface characterisation of nanocrystalline diamonds
pdf – 823 kB
 

Related news