Large-scale physical failure analysis of multi-layered optoelectronic devices with the new TESCAN S9000X Xe plasma FIB-SEM

Aug/21/2018

Extra-large area cross-sectioning in OLED displays using the TESCAN Xe plasma FIB technology

Organic Light Emitting Diodes (OLEDs) is a flat light emitting technology, consisting of a series of organic thin films placed between two conductors. OLED dis­plays are nowadays produced in mass for mobile phones, tablets, TVs, and wearables. Physical failure analysis of OLED/AMOLED displays can be quite tricky due to the presence of a large variety of materials such as polyimide, ITO, glass, organic layers, Al electrodes and other metals whose physical properties differ significantly from each other. These materials are placed in the form of very thin films whose thicknesses can range even in the nanometer scale. The TESCAN S9000X is a Xe plasma focused ion beam scan­ning electron microscope that has it all for preparing large-area cross-sections in displays that can be as large as 1 mm-wide, and at the same time, provides high resolution and excellent contrast at low beam energies required to image and resolve such delicate and small structures in displays.

Download the new TESCAN Application Example below and find out more information.



Application Example

Extra-large-area cross-section in an OLED display using the new TESCAN S9000X
Organic Light Emitting Diodes (OLEDs) is a flat light emitting technology, consisting of a series of organic thin films placed between two conductors. When an electrical current is applied, a bright light is emitted. OLEDs are emissive display that do not require a backlight, and as a result, are thinner and more efficient than LCD displays (which do require a white backlight). Other advantage of OLED displays is that they are flexible. For this reason, OLED technology has recently gained significant presence in today’s display market. OLED displays are nowadays produced in mass for mobile phones, tablets, TVs, and wearables.
pdf – 497 kB