LYRA3 GM - A multifunctional Tool for Nanotechnology

The Newest generation FIB-SEM workstation from TESCAN delivers state of the art integration of a best-in-class Focused Ion Beam column and Field Emission Scanning Electron Microscope, while integrating an unprecedented range of nano-structuring, imaging, and nano-analytical tools.
The integration of so many complementary analytical tools will allow researchers to characterize complex samples and solve analytical problems rapidly.
The LYRA GM can be configured with a variety of Focused Ion Beam sources and is the first in its class to integrate a Time of Flight secondary ion mass spectrometer (TOF-SIMS) and in situ Atomic Force Microscope (AFM).
The LYRA GM will be showcased next month, August 8th thru the 11th at the upcoming Microscopy and Microanalysis conference in Nashville, Tennessee