New application example on FIB-SEM tomography

Mar/02/2017
Check out the new application example on FIB-SEM tomography of wood revealing its microstructure.
 
The aim of this application example is to perform a FIB tomography of wood in order to analyze its cellular structure, display the structure and morphology of simple pits in wood rays, and, describe the inner micro/nano structure of simple pits. The dual beam FIB-SEM TESCAN LYRA3 microscope was used.

3D reconstruction of the region of interest and pit connection interphase between wood´s ray cells.
3D reconstruction of the region of interest and pit connection interphase between wood´s ray cells.


Documents for download

3D focused ion beam tomography of wood sample
While X-ray tomography can achieve sub-micron imaging resolutions, focused ion beam (FIB) tomography can extend below 10 nm voxel sizes. In FIB tomography, the voxel size is basically limited by the maximum resolution of the SEM which is used for imaging. In general, the process works on the ground of sequential imaging of many surfaces (stacks) polished by FIB. The stacks are then used to reconstruct a 3D model of the specimen. The 3D model can be generated with thousands of slices, at a rate of one slide per minute.
pdf – 1 MB

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