SEM and EBSD analysis of the grain structure after ECAP process of the aluminum material

Sep/19/2019
The new TESCAN CLARA, a field-free analytical UHR-SEM for nanoscale materials characterization, brings improved potential for analytical techniques.

Based on TESCAN’s innovative BrightBeam™ technology, TESCAN CLARA offers improved imaging resolution and maximum signal collection at low landing energies. Automatic beam optimization across the full energy and probe current range ensures the smallest spot size even at high currents and low beam energies, simultaneously providing improved imaging resolution, high spatial resolution analytical results, and high analytical throughput.

The goal of this short application example SEM and EBSD analysis of the grain structure after ECAP process of the aluminium material is to demonstrate the potential of the TESCAN CLARA UHR-SEM to analyze fine structured material with very small grains. The electron channelling imaging technique and EBSD method were used to demonstrate the capabilities to analyze small details at high beam currents.

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Application Example

SEM and EBSD analysis of the grain structure after ECAP process of the aluminum material
pdf – 1.6 MB

Fig. 1: Channeling contrast of the sample treated by 8 steps of ECAP.
Fig. 2: Channeling contrast combined with the sample surface topography information of the sample treated by 8 steps of ECAP.
Fig. 1: Channeling contrast of the sample treated by 8 steps of ECAP. Fig. 2: Channeling contrast combined with the sample surface topography information of the sample treated by 8 steps of ECAP.