TESCAN CLARA | New Field-Free UHR SEM

Aug/06/2019
TESCAN proudly presents the TESCAN CLARA field-emission scanning electron microscope to the materials science community at the Microscopy and Microanalysis (M&M) 2019 conference in Portland, USA.
TESCAN CLARA is our latest field-free Ultra-High Resolution (UHR) SEM, designed to meet the evolving needs of materials scientists to characterize morphology and composition of novel materials at the micro- and nano-scale.

Combining field-free optics, for ultra-high resolution low kV imaging, with advanced energy and angle-selective in-column secondary and backscattered electron acquisition capabilities, CLARA is the ideal choice for central analytical facilities and materials research labs who value not only low kV resolution, but also the ability to select secondary and backscattered electron contrast methods to explore the information which the sample may contain.


Full Press Release
TESCAN CLARA
TESCAN CLARA