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TESCAN S8000 a versatile microscope with a variety of imaging modes

Feb/21/2018
New SEM Application Example: "High resolution images of large samples with the TESCAN S8000 microscope"
Wide field of view is a very much appreciated feature in scanning electron microscopy (SEM). Not only because of the possibility to provide images of large objects with high resolution and excellent topographical and material contrast but also in terms of sample navigation. The TESCAN S8000 allows obtaining an undistorted large field of view images that can be as large as up to tens of millimeters.
 
Do you want to know more? Please download the Application Example from the link below.


Sample: mechanism of a Swiss watch. Images acquired in the Depth mode with the E-T (top left) and BSE (bottom left) detectors. Image acquired in the Wide Field mode with the BSE detector.
 

Application Example

High resolution images of large samples with the TESCAN S8000 microscope
pdf – 817 kB