Subcellular analysis

Subcellular analysis provides information hidden under the surface of cells and tissue. Typically this area of research has been a domain of transmission electron microscopy. However, SEM technology is becoming more popular in this field, due to emerging techniques available with scanning electron microscopy solutions. TESCAN offers several solutions for scientists interested in the subcellular investigations of biological samples.
  • First approach involves incorporation of a removable STEM detector inside the SEM chamber, thus transforming any TESCAN SEM into a low-kV TEM instrument.
  • STEM detector is fully compatible with standard grids routinely used in TEM microscopes.
  • Another approach uses serial sectioning inside the SEM instrument followed by imaging. The sectioning can be done either by implementing an ultramicrotome inside the chamber or directly by focused ion beam technology.
  • By serial sectioning of the samples followed by subsequent segmentation and rendering, researchers can easily visualize the relevant data in 3D.
Subcellular analysis
STEM Image of cyanobacteria

Related Application Notes

Low temperature scanning electron microscopy for Life Sciences
Low temperature scanning electron microscopy (Cryo-SEM) has become an established technique for capturing and observing biological samples close to their natural state. It is a method of choice, where the traditional sample preparation (e.g. critical point drying) causes unwanted changes in the sample structure. A Cryo-SEM workflow typically involves sample fixation using either flash-freezing in a liquid nitrogen slush or high-pressure freezing. The frozen samples are then transferred under vacuum to a cryo sputter coater, where they are coated with a conductive layer of metals or carbon. Finally, the samples are inserted into a SEM chamber equipped with a cryo-stage and observed in high vacuum environment.
pdf – 4.8 MB
High resolution analysis of thin foils using the STEM Detector with HADF
Performing scanning transmission electron microscopy (STEM) in a scanning electron microscope (SEM) is a popular technique for laboratories without transmission electron microscopy (TEM) capabilities. The new option for TESCAN STEM detector extends the imaging capabilities by simultaneous acquisition of multiple signals from transmitted and diffracted electrons including bright field, dark field and high angle dark field. The STEM analysis can be further supplemented with transmission EDX or EBSD microanalysis for receiving higher resolution, utilizing the available analytical techniques of the SEM.
pdf – 1.7 MB
STEM detector in life science applications
Scanning transmission electron microscopy (STEM) has become a highly effective, easy-to-use technique for imaging biological thin sections (lamellae) in SEM. Multiple sample observation, automated stage navigation, and ultra-high resolution imaging make this technique an attractive solution for high-contrast observation of TEM sections with excellent results, and minimal operator’s time.
pdf – 2.4 MB