Steels & Metal Alloys

High resolution and large depth of focus are the main functions which make scanning electron microscope (SEM) a great tool for observing topographic features of samples made of steel and metal alloys.
Metal alloys are composed of two or more metals. These alloys usually have improved electrical, mechanical or electrical properties compared to their constituent components, which significantly extend their applications. Examples of alloys are steel, solder, brass, bronze, etc.
  • Steels and metal alloys are very important materials for engineering, construction, automotive and aviation industries.
  • Steels are made of iron as the main element, with carbon and other elements such as manganese, molybdenum, nickel, referred to as alloying elements.
  • Steels have a wide range of mechanical properties that can be modulated using different alloying elements and heat treatments.
Our patented aperture-free Wide Field Optics™ allows scientists to easily switch between different viewing modes. The Wide Field mode allows for imaging extra-large objects (e.g. damaged tools) at low magnification without distortions. The Depth mode is ideal for imaging samples with complex topography such as fractured surfaces. Detailed features such as carbides, grain boundaries, and dislocations are observed in the Resolution mode.
Steels & Metal Alloys
Inconel – fractured surface

Related Application Notes

High resolution analysis of thin foils using the STEM Detector with HADF
Performing scanning transmission electron microscopy (STEM) in a scanning electron microscope (SEM) is a popular technique for laboratories without transmission electron microscopy (TEM) capabilities. The new option for TESCAN STEM detector extends the imaging capabilities by simultaneous acquisition of multiple signals from transmitted and diffracted electrons including bright field, dark field and high angle dark field. The STEM analysis can be further supplemented with transmission EDX or EBSD microanalysis for receiving higher resolution, utilizing the available analytical techniques of the SEM.
pdf – 1.7 MB
Electron Channelling Pattern Acquisition on Polycrystalline Materials
The electron channelling pattern (ECP) is an image of the pseudo-Kikuchi lines that can be acquired on a crystalline material with the scanning electron microscope (SEM). In the special scanning mode called Channelling the beam is rocking around one point and creates a selected area channelling pattern (SACP). The latest generation of TESCAN scanning electron microscopes have improved this method also for the evaluation of the individual grain orientation in some polycrystalline materials.
pdf – 1.1 MB
Microstructure Anisotropy Study of Cold-Drawn Wires using 3D EBSD and Xe+ Plasma FIB
Wires commonly used in the electronic industry are usualy prepared by cold drawing from a thicker wire. The drawing process causes the development of a fibrous microstructure and crystallographic texture, accompanied by increased hardness and electrical resistivity along the applied deformation. Therefore the cold drawing should be followed by short annealing, however some anisotropy remains, depending on the level of deformation.
pdf – 2.5 MB