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FIB-SEM
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TESCAN S8000G
TESCAN S8000G
The TESCAN S8000G
is the first member of a
new family of TESCAN microscope – The S8000 series.
The TESCAN S8000G is a FIB-SEM system which has all that it takes to meet the demands of today’s research in both industry and academia; it delivers outstanding image quality with superb contrast ideal for nanocharacterisation and the capability to perform complex nanoengineering tasks with extreme precision and incomparable ease.
It is equipped with the
new BrightBeam™ SEM column
which achieves truly uncompromised
field-free ultra-high resolution (UHR)
for maximum versatility in analysis including the
analysis of magnetic samples
and
live SEM monitoring during FIB operations
. The new column is equipped with an electron optics design that improves resolution especially at low beam energies ideal for imaging beam-sensitive and nonconductive samples. On the other hand, the synergy of the
novel Orage™ Ga FIB column
fitted with state-of-the-art ion optics and the
newly designed OptiGIS™ gas injection system
makes TESCAN S8000G a world-class instrument for sample preparation and nanopatterning.
Modular and workflow-oriented software
assures maximum control in all your applications, and, no trade-offs between complex technology and user-friendliness. The TESCAN S8000G is ideal for high-end FIB-SEM applications and, the analytical platform of choice for all those who pursue better understanding and breakthroughs in science and technology on daily basis.
Key features
New BrightBeam™SEM column technology for uncompromised UHR
New BrightBeam™ SEM column
with proprietary 70° combined electrostatic-magnetic objective lens for maximum universality.
Field-free ultra-high resolution
imaging for maximum versatility in imaging and analysis including the analysis of magnetic samples and live SEM imaging during FIB operations.
New detection system
including
In-Beam Axial detector
and
Multidetector
for
angle-selective and energy-selective
signal collection gives complete control on surface sensitivity and the option to explore with different contrast for sharpening your senses and deepening your insight.
New generation of electronics
with up to 8 live signal channels simultaneously.
New Field Emission Schottky electron gun now enabling
beam currents up to 400 nA
and rapid beam energy changes.
EquiPower™ lens technology for
efficient thermal power dissipation and excellent electron column stability
.
Beam Deceleration Technology (BDT)
for further improved resolution at low and ultra-low electron beam energies with
simultaneous detection of SE and BSE
signals. (optional)
Novel Orage™ Ga FIB column for the most challenging nanoengineering tasks
Novel Orage™ Ga FIB column
for ultra-high resolution ion beam and excellent performance throughout the entire range of ion beam currents and full energy range down to 500 eV.
Resolution
< 2.5 nm at 30 keV.
World-class quality in sample preparation with excellent performance at low energies for preparing
damage-free ultra-thin TEM specimens.
High
FIB currents up to 100 nA
and SmartMill strategy for fast large-volume milling and slash by half the time for completing your cross-sectioning and lamella lift-out processes.
Fast FIB nanotomography
for unique ultra-structural information of your samples.
New single gas injection system OptiGIS
with fast run up time and excellent stability of the deposition/etching rate. Up to 6 OptiGIS units is possible in one instrument.
Combination of field-free SEM imaging and high FIB currents allow fast and uninterrupted milling/imaging sequences and advanced recipes for
TEM/atom probe
sample preparation or
FIB-SEM tomography
.
TESCAN S8000G
Product brochure
TESCAN S8000G brochure
pdf – 3.2 MB
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Materials Science
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Application Example
TEM specimen preparation for ultrastructural studies of surface passivated porous Au nanoparticles
pdf – 1.4 MB
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Application Example
Large-area Cross-sectioning for Failure Analysis of Advanced Packaging Technologies
pdf – 1.5 MB
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Application Example
Automated Milling of Micro-Compression Pillar Arrays
pdf – 549 kB
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TESCAN S8000G microscope
Semiconductors & Microelectronics
See more in the Semiconductors section!
Materials Science
See more in the Materials Science section!
Life Sciences
See more in the Life Sciences section!