TIMA-X TESCAN Integrated Mineral Analyser

TIMA-X is an automated mineralogy system for fast quantitative analysis of samples such as rocks, ores, concentrates, tailings, leach residues or smelter products.
TIMA-X combines BSE and EDX analysis to identify minerals and create mineral images that are analysed to determine mineral concentrations, element distributions, and mineral texture properties such as grain-size, association, liberation and locking parameters. TIMA-X can also search for bright phases containing platinum group, gold, silver, rare earth and other minerals.

TIMA-X uses up to four EDAX Element silicon drift detectors and new software to significantly increase both performance and reliability. TIMA-X detectors are a new design that increases sensitivity to light elements and maintains stable energy resolution at very high count rates. TIMA-X detectors are fully compatible with both TIMA operation and EDAX Quantitative EDX systems and allow the user to enjoy the full speed of TIMA-X while maintaining the capabilities of standard-based quantitative analyses. TIMA-X software has many unique features including a new generation of mineral identification tools and low element detection limits using its patented pixel analysis algorithms.
For high-throughput applications, it can be fitted with the AutoLoader™ - a robotic sample loading system for 24/7 unattended measurement of up to 100 epoxy blocks. AutoLoader increases productivity by transforming mineralogy measurement from a batch to a continuous process by eliminating manual sample exchanges and chamber pump-down.
 

 

Key Hardware Features

  • Based on TESCAN MIRA Schottky field emission or VEGA thermionic emission SEM
  • Up to four integrated EDX detectors for maximum system throughput performance
  • Latest generation of Peltier-cooled SDD detectors
    • New 30 mm2 SDD CMOS vacuum encapsulated chip
    • Si3N4 ceramic window is rugged, non-porous and has high transmissivity
  • Compatible with full-function standards-based quantita­tive EDX analysis

Unique Features

  • Complete hardware integration of the X-ray acquisition and beam scanning system
  • AutoLoader™ for 24/7 continuous and unattended automated operations of large sample sets
  • Summing of low-count spectra for lower detection limits
  • Direct quantitative EDX analysis of TIMA measured X-ray spectra
  • Workflow and tools for simpler building of mineral classification schemes
  • Interactive measurement validations and investigation tools

Key Software Features

  • Comprehensive offline mineral re­classification, investigation, image processing, reporting and interpre­tation functions
  • Built-in application-oriented config­urable data management system
  • A catalogue of workbooks for saving groups of images, charts and tables
  • Automatic backup of reporting meta data
  • Accurate SEM field stitching
  • Built-in interactive, detailed, context sensitive user help manual
 

Key Support Features

  • ‚‚Continuous improvement
  • ‚‚Free regular software updates
  • ‚‚All components are supplied and maintained by
  • TESCAN, no third party support needed

„„Online Interactive Tools

  • Built-in custom spectral analysis tools to help in identification and composition
  • ‚‚Built-in custom EDX analysis for chemical composition directly from measurements
  • ‚‚Tool kit for easy addition of new phases from measured sum spectra, compositions, formulae and spectral standards
  • ‚‚Mineral composition library look-up from 4700 mineral compositions for suggested mineral names and ZAF corrected synthetic spectra from formulas and compositions
  • ‚‚Rapid reclassification (reanalysis) when “teaching” the system to recognise new materials


Online Measurement Features and Modes

Low detection limits for elements by combining multiple low-count spectra using a patented spectrum similarity zonation algorithm
  • ‚‚Built-in EDX quantitative composition analysis from standards and directly from measurement
  • ‚‚Spot mode measurement that integrates high-resolution BSE images with a lower resolution X-ray measurement mode for allowing users to optimize measurement time against accuracy of mineral identification
 
TIMA-X TESCAN Integrated Mineral Analyser
TIMA-X

Product Brochure

TIMA-X Brochure
TIMA-X is an automated mineralogy system for fast quantitative analysis of samples such as rocks, ores, concentrates, tailings, leach residues or smelter products. TIMA-X combines BSE and EDX analysis to identify minerals and create mineral images that are analysed to determine mineral concentrations, element distributions, and mineral texture properties such as grain-size, association, liberation and locking parameters. TIMA-X can also search for bright phases containing platinum group, gold, silver, rare earth and other minerals.
pdf – 2.8 MB

Applications of TIMA

Automated mineralogy and petrology - applications of TESCAN Integrated Mineral Analyzer (TIMA)
The collection of representative modal mineralogy data as well as textural and chemical information on statistically significant samples is becoming essential in many areas of Earth and material sciences. Automated Scanning Electron Microscopy (ASEM) systems provide an ideal solution for such tasks. This paper presents the methods and techniques used in the recently developed TESCAN Integrated Mineral Analyzer (TIMA-X) with Version 1.5 TIMA software. The benefits from the use of a fully integrated quantitative energy-dispersive X-ray spectrometry (EDS) and an advanced statistical approach to ASEM systems are demonstrated. Typically, the system can handle more than 500,000 X-ray events per second. Using a common spectral total of 1000 events this represents the acquisition of 500 spectra per second. A number of measurement modes is available to make the most effective use of these spectra depending on the application.
pdf – 4.6 MB