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Scanning Electron Microscopes (SEM)
Tescan's SEM platforms provide high-resolution imaging and surface analysis with exceptional contrast, detail, and ease of use — ideal for materials research, quality control, and analytical applications.
Tescan's portfolio spans SEM, FIB-SEM, 4D-STEM, laser and micro-CT systems — designed to serve advanced research, development, and quality control. From nanofabrication and TEM sample prep to non-destructive 3D imaging, our instruments combine precision, flexibility, and application depth across every major scientific and industrial domain.
Whether you're solving challenges in failure analysis, technology pathfinding, or process optimization, Tescan systems adapt to your goals — today and in the future.
Whether you're solving challenges in failure analysis, technology pathfinding, or process optimization, Tescan systems adapt to your goals — today and in the future.
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Focused Ion Beam-Scanning Electron Microscopes (FIB-SEM)
Tescan's FIB-SEM systems combine fast, precise milling with high-resolution imaging and advanced automation. Choose from Ga+ or Xe plasma FIB sources to match your needs in sample prep, prototyping, or failure analysis.
Micro-Computed Tomography (micro-CT)
Tescan's X-ray micro-CT systems deliver fast, high-resolution 3D and 4D imaging for non-destructive internal analysis. Dynamic in-situ capabilities and modular designs make them ideal for advanced research across materials, life sciences, and energy storage.
Multimodal Analytical STEM
Tescan's TENSOR™ is the first fully integrated and synchronized analytical STEM platform built for intuitive multimodal nanocharacterization of a wide variety of samples, combining structural, morphological, and chemical insights. It is optimized for high-resolution crystallographic and structural analysis enabling full microscope automation, on-the-fly data processing for interactive analysis of samples, and scripting of new workflows that all together make it ideal for both routine and advanced research.
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Laser Solutions
FemtoChisel™ is the next-generation femtosecond laser solution built specifically for semiconductor sample preparation and failure analysis. For too long, the industry has had to compromise between throughput, precision, and surface quality. Now all are delivered on one integrated platform.
Ex Situ Lift-Out Solutions
Tescan EXLO™ is designed for laboratories where TEM throughput, reproducibility, and cost efficiency matter. By moving specimen lift-out outside the FIB-SEM, EXLO™ keeps valuable beam time focused on milling, while parallelizing lamella transfer and grid mounting. The result: higher output, lower cost per specimen, and a more efficient workflow.
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Ion Implantation and UHV FIB-SEM Solutions
Tescan's advanced systems support operation under demanding conditions — from controlled ion implantation to analytical tasks performed in ultra-high vacuum environments — while offering the freedom to customize system configuration and workflows to your specific research needs.
extend workflows with specialized capabilities.
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Tescan Nanomanipulator
Purpose-built nanomanipulator for repeatable TEM/STEM and APT lift-out
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Tescan Essence™ DrawBeam
Expandable software module for high-precision nanopatterning and nanofabrication applications
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Tescan MultiVac
Imaging Insulating Samples Without Compromise
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Tescan Essence™ EBL Kit
Beyond Conventional Materials Science: Design, Create and Analyse Next Generation Sensors and Devices
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Tescan Optical Navigation and Correlation Camera
Navigate by true color, image correlation, or unseen marks beyond SEM contrast
Tescan Rocking Stage
High-throughput, artifact-free cross-sectioning with continuous visibility of the milling front, enabling accurate end-pointing, faster 3D tomography, and pristine results even at high FIB beam currents.
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Tescan TRUE X-Sectioning
Ripple-free plasma FIB cross-sectioning without sacrificing speed or beam current
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Tescan FIB-SEM Tomography
High-resolution 3D insight for complex materials
Tescan TEM AutoPrepTM Pro
AI-driven, fully automated TEM/STEM preparation for both Ga and plasma FIB that stays reliable, repeatable, and accurate on any sample type.
Built around your needs
