TESCAN is proud to be a Platinum Sponsor of M&M 2021!
We hoped to see you in person at M&M 2021, in our hometown of Pittsburgh. As this is still not possible, we’ve worked hard to prepare a robust virtual program, and hope that you’ll join us for our presentations and demonstrations, or just drop in for a chat!
LIVE PRESENTATION SCHEDULE
Join our Spatial Chat room for live presentations by TESCAN product specialists, and enter to win an Apple Watch!
In just 15 minutes you can learn about how TESCAN can help you achieve your application goals.
As an additional bonus – when you attend any of our presentations you will be sent a TESCAN bottle opener that can be redeemed for a free beer (or beverage of your choice) the next time you see a TESCAN representative!
August 4 at 12:30 pm ET
TEM lamella preparation – steps towards fully automated process | Lukáš Hladík
August 4 at 1:30 pm ET
Pushing the limits of time-resolved CT – TESCAN Dynamic micro-CT | Wesley De Boever, PhD
August 5 at 11:00 am ET
Automated delayering on the state-of-the-art semiconductor devices | Lukáš Hladík
August 5 at 12:00 pm ET
TESCAN 3D FIB-SEM tomography of biological samples | Martin Sláma
M&M SCIENTIFIC PROGRAM
Curious about our micro-CT systems?
TESCAN’s dynamic micro-CT solutions offer real-time, in-situ observation of complex physical processes, such as compression, torsion, tension, flow, heating, cooling, growth, dissolution, and many other dynamic events. The unique designs of our micro-CT systems can open the door to a new perspective on your research.
Tuesday, August 3
- 12:30 – 1:30 pm ET | Dynamic X-ray micro-CT insights of the recovery of ore bodies in presence of clay
- 5:15 – 6:45 pm ET | Can an iPhone save your life? Multimodal forensic analysis of bullet damage to a smartphone
Wednesday, August 4
- 2:15 – 3:15 pm ET | Time-resolved dynamic micro-CT imaging of food products in the lab
Thursday, August 5
- 12:45 – 1:45 pm ET | In situ dynamic X-ray micro-CT for additive manufactured parts
INTERESTED IN A PRODUCT DEMO?
TESCAN applications specialists will be providing virtual demonstrations of select SEM and FIB-SEM systems, and we invite you to register to see our instruments in action.
If you don’t see the system you’re interested in learning about, let us know! We would be happy to arrange a separate demonstration with the most appropriate equipment.
Scanning electron microscopy is a well-known non-destructive technique that uses an electron beam probe to analyze a sample’s surface down to nano-scale. The scanning electron microscope produces high magnification images with high resolution, which makes the technique suitable for a wide range of applications and in numerous fields of science and industry.
The focused ion beam scanning electron microscope (FIB-SEM) is a two-column system that incorporates both electron and ion columns. The FIB-SEM system is configured so that the electron and ion beam focal points coincide, resulting in the optimization of many applications. Such a feature enables simultaneous SEM imaging during FIB milling tasks – a significant leap in terms of performance and throughput in all those FIB operations that demand ultimate levels of precision.
TESCAN’s Dynamic micro-CT technology enables the identification of complex, microscopic events within your sample through time-correlated observation of physical changes, and it achieves this in real-time. TESCAN’s true 4D Dynamic micro-CT is not just an extension of traditional 3D-based x-ray tomography or simple 3D time-lapse of x-ray images. TESCAN Dynamic micro-CT solutions are offering real-time, complex in-situ dynamic micro-CT capabilities, recording and visualizing a multitude of physical processes.