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TESCAN MAGNA
UHR SEM for nanomaterials characterization at sub-nanometer scale
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TESCAN SEM Solutions for Materials Science
TESCAN MAGNA
High-resolution and high-contrast imaging of nextgen materials (e.g. catalyst structures, nanotubes, nanoparticles and other nanoscale structures)
Excellent platform suitable for SEM/STEM metrology at sub-nanometer scale
Fast setup of the electron beam – optimal imaging conditions are guaranteed by the In-Flight Beam Tracing™
Multi-detector system TriBE™ and TriSE™ for sample nanocharacterization
Intuitive software modular platform designed for effortless operation regardless users’ skill level
Black Si with Au nanoparticles
Black Si with Au nanoparticles
STEM image of mesoporous silica
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TESCAN MAGNA
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