TESCAN MAGNA

UHR SEM for nanomaterials characterization at sub-nanometer scale

Home Product Portfolio TESCAN SEM Solutions for Materials Science TESCAN MAGNA

High-resolution and high-contrast imaging of nextgen materials (e.g. catalyst structures, nanotubes, nanoparticles and other nanoscale structures)
Excellent platform suitable for SEM/STEM metrology at sub-nanometer scale
Fast setup of the electron beam – optimal imaging conditions are guaranteed by the In-Flight Beam Tracing™

Multi-detector system TriBE™ and TriSE™ for sample nanocharacterization
Intuitive software modular platform designed for effortless operation regardless users’ skill level

: Black Si with Au nanoparticles

: Black Si with Au nanoparticles

: STEM image of mesoporous silica

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TESCAN MAGNA

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UHR imaging of nanoparticles in fly ash

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TESCAN Wide Field Mode

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TESCAN Essence Collision Model

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Product Flyer

TESCAN MAGNA

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