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TESCAN MAGNA

UHR SEM for nanomaterials characterization at sub-nanometer scale

Home Product Portfolio TESCAN SEM Solutions for Materials Science TESCAN MAGNA
  • High-resolution and high-contrast imaging of nextgen materials (e.g. catalyst structures, nanotubes, nanoparticles and other nanoscale structures)
  • Excellent platform suitable for SEM/STEM metrology at sub-nanometer scale
  • Fast setup of the electron beam – optimal imaging conditions are guaranteed by the In-Flight Beam Tracing™

  • Multi-detector system TriBE™ and TriSE™ for sample nanocharacterization
  • Intuitive software modular platform designed for effortless operation regardless users’ skill level

  • TESCAN MAGNA

    Product Brochure

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  • TESCAN MAGNA

    Product Flyer

    pdf 478 KB Download

  • TESCAN Wide Field Mode

    Product Flyer

    pdf 281 KB Download

  • TESCAN Esscence 3D Collision Model

    Product Flyer

    pdf 215 KB Download
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