Advanced SEM
Built for Discovery

Compact analytical SEM for routine materials analysis

Tescan VEGA Compact delivers high-resolution imaging and integrated EDS in a simplified, space-efficient system. Researchers benefit from Tescan Essence™ software and a large chamber designed for industrial-scale samples, both supporting reliable, everyday materials analysis.

Key benefits

• Large-sample capacity: A spacious chamber and stable high-vacuum conditions support efficient analysis of large or multiple samples with dependable EDS results.
• Fast beam optimization: In-Flight Beam Tracing™ helps you set optimal beam conditions quickly.
• Integrated EDS correlation: Essence™ EDS overlay tools let you view morphology and composition together in one intuitive interface.

Modular FEG-SEM for analytical research and failure analysis

Tescan MIRA gives you high-current, high-resolution imaging with Schottky FEG optics and support for EDS, EBSD, CL, STEM, and nanoprocessing. Its modular design and upgrade options let you expand capabilities as your analytical needs grow in research and QA/QC.

Key benefits

• Faster beam setup: In-Flight Beam Tracing™ and Wide Field Optics™ support quick beam optimization and smooth navigation
• High-throughput analysis: Stable performance for advanced EDS/EBSD mapping and compositional workflows
• Expandable platform: Modular hardware and correlative method support help labs adapt to evolving analytical requirements.

UHR FEG-SEM for shared labs and quality control environments

MIRA XR gives you BrightBeam™ UHR optics, Wide Field Optics™, and Dual Essence™ EDS for high-resolution imaging and live compositional analysis. Designed for diverse users, it handles charging, non-conductive, and outgassing samples with confidence.

Key benefits

• Reduced rework and training time: Macro-to-nano navigation and automated beam optimization help you reach the right settings quickly.
• Nanometer-scale detail at low keV: Advanced SE/BSE detection and automated column alignments support your high-resolution imaging and analysis.
• Higher throughput on challenging samples: MultiVac™ and Auto LowVac Aperture give you more control and stability when working with difficult materials.

Field-free UHR SEM for high-contrast imaging of sensitive materials

Tescan CLARA gives you sub-nanometer resolution with BrightBeam™ optics and flexible detection options. Designed for delicate and non-conductive samples, it supports multimodal workflows and in-situ experiments with strong contrast at low keV.

Key benefits

• Artifact-free imaging: Field-free optics and low-keV detection help you image magnetic, charging, and beam-sensitive samples confidently.
• Selective insights in a single scan: Energy-filtered, in-column multi-detectors give you combined topography and composition information in one pass.
• Support for advanced workflows: Modular hardware and open scripting options let you adapt CLARA to correlative and dynamic applications as your research evolves.

Immersion UHR SEM for contrast-critical nanoscale imaging and STEM-in-SEM analysis 

Tescan MAGNA gives you TriLens™ immersion optics and energy-selective detectors that produce clear, unmixed contrast at high resolution. You can maintain image quality at long working distances and on tilted surfaces, enabling detailed analysis of cross-sections, nanomaterials, and complex failure features.

Key benefits

• Clear SE/BSE contrast: TriSE™ and TriBE™ detectors provide well-defined signals so you can distinguish surface and compositional information with confidence.
• High resolution at long working distances: Stable sub-nanometer performance supports your work on complex sample geometries and challenging orientations.
• STEM-in-SEM capability: Integrated STEM-in-SEM lets you perform advanced nanoscale characterization without switching platforms.

Automated mineralogy SEM for quantitative particle-by-particle analysis

Tescan TIMA gives you high-throughput SEM-EDS with automated mineral identification and textural analysis to produce reproducible, quantitative mineralogical data at scale. Its integrated correlative imaging and fully automated workflows support exploration, process optimization, and academic research while removing manual interpretation and user bias.

Key benefits

• Robust mineral data: Four EDS detectors and spectral summing deliver reliable phase, texture, and liberation measurements, even for low-abundance minerals.

• Lower workload: Unattended acquisition, automated classification, and offline analysis reduce the time you need to spend on manual tasks.
• Stronger process insights: Correlative imaging links composition with particle structure and spatial relationships to support exploration and process optimization.