TESCAN offers two options for adding automated serial sectioning, imaging and data collection capabilities to TESCAN FIB-SEM instruments. TESCAN FIB-SEM Tomography Basic and Advanced packages.
TESCAN FIB-SEM Tomography Advanced brings new capabilities to Ga FIB and Plasma FIB serial sectioning, giving a broader range of choices for 3D data acquisition and subsequent visualization. New features include multi-modal data acquisition at varying conditions; support for TESCAN’s Rocking Stage to improve speed and quality for large volume data acquisitions on Plasma FIB instruments; and several improvements to high resolution tomography data acquisition, like fine autofocus or Ga source auto-heating for data collection requiring greater than 60 hours to complete. TESCAN’s FIB-SEM Tomography basic package continues to support routine “slice & view” serial sectioning and 3D image acquisition requirements.
Both FIB Tomography packages adopt the ease of use principles of TESCAN’s Essence GUI, with step-by-step guided workflows. Following the acquisition, data can be imported to TESCAN’s new 3D Volume Analysis software for offline 3D data reconstruction and visualization.
Read more about the new TESCAN FIB-SEM Tomography – Press Release.