“The introduction of the GAIA3 continues our tradition in providing unique high performance instrumentation to our customers”, said Martin Zadrazil, Chief Operating Officer of TESCAN ORSAY HOLDING. “The GAIA3 will expand the applications and customer segments we can address in our market.”
The proven 3rd generation TESCAN design ensures the highest reliability and uptime with uncompromised ease of use for TEM sample preparation, advanced electron and ion beam lithography, and all forms of 3D characterization, including cryo integration. The workstation concept holds true for all multi-user environments, as the GAIA3 will enable novice and advanced users alike to achieve optimum results. The GAIA3 provides newly designed electron column having resolution < 1.5 nm @ 1 keV together with high performance ion column having resolution < 3 nm @ 30 keV.
TESCAN will deliver the first GAIA3 FIB-SEM workstation in October of 2014.
For live demonstrations and further information please visit us at booth 7 in Prague, or contact TESCAN at [email protected]
TESCAN ORSAY HOLDING is a leading provider of scientific instrumentation and is well known for its innovation and openness to work with researchers, customizing applications to fit specific needs. Established in 1991, TESCAN is an ISO certified company with a long tradition of excellence. Over 1700+ TESCAN Electron Microscopes and Focused Ion Beam workstations have been delivered around the world.