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Thin-film transistor display lamella preparation using Xe Plasma FIB

Check out how to prepare high-quality large TEM lamellae

Thin-film transistor display lamella preparation using Xe Plasma FIB

In this application note we describe and present the preparation process of a TEM specimen from a TFT display array on glass substrate. The lamella was prepared using the TESCAN UHR-SEM/plasma FIB XEIA3 microscope.

 

18.05.2017
  • Thin-film transistor display lamella preparation using Xe Plasma FIB

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