Current trends in electron microscopy include increased focus on the analysis of beam-sensitive biological materials such as tissue or cell cultures. Modern scanning electron microscope (SEM) column designs are able to acquire images at very low accelerating energies, which is key for efficient visualization of these sensitive biological samples at scales approaching the nanometer range.
Combining SEM with the site-specific milling capability of the focused ion beam (FIB) opens a broader range of possibilities for studying biological samples.
In the seminar, we will discuss the capabilities of FIB-SEM solutions for detailed structural analysis of biological samples, including recent trends for using plasma-based FIB-SEM solutions to reveal the highest details in large volume sample analyses.
Presenter: Martin Slama
About Martin Slama
Martin Slama is a Product Manager for FIB-SEM in Material Science and Life Science with over 5 years of experience in conventional and advanced TEM preparation methods using TESCAN’s plasma FIB and Ga+ FIB-SEM solutions for Materials Science. Prior to joining TESCAN, Martin worked in the field of new material development and characterization at Brno Technological University, CEITEC, and Aston University.