TESCAN Webinar:
Advanced 3D Characterization of Your Biological and Beam Sensitive Samples
On demand
ENGLISH
Structural analysis of biological samples helps researchers better understand complex relationships between the structure and function of organelles, cells, and tissues. Combining the scanning electron microscope (SEM) with a nano-machining capability of the focused ion beam (FIB) opens a wide range of possibilities. FIB-SEM systems are widely used for routine preparation of ultra-thin transmission electron microscopy (TEM) specimens and for their capability of precise cross-sectioning and 3D volume imaging.
This webinar offers a practical overview of SEM imaging applications and focuses on the advanced 3D characterization of biological and beam sensitive samples. We will introduce techniques such as:
- Serial Block-Face Imaging (SBFI),
- 3D FIB-SEM tomography using Ga-FIB for precise and highly detailed analysis,
- Plasma Xe-FIB for large volume analysis.
Presenter: Ondrej Sulak
About Ondrej Sulak
Ondrej Sulak received his Master degree from Analytical chemistry at Masaryk University in the Czech Republic. Then, he moved to France where he continued his Ph.D. studies and Postdoctoral research at Joseph Fourier University in Grenoble where he was focused on the structure-functional characterization of carbohydrate-binding proteins, mainly by X-ray crystallography, Electron Microscopy, SAXS, and other techniques. His industrial career he started in the biotechnological company where he was responsible for biochemistry department. In 2016, Ondrej joint TESCAN as Global Applications Director. Since January 2019 he works as Product Marketing Director for Life Sciences segment.