Low-temperature electron microscopy (cryo-EM) has become an established technique for capturing and observing beam-sensitive samples in their close-to-natural state.
Cryo-sectioning is a standard method used for thinning and slicing such samples. However, the integrity of the specimens can be degraded easily by common artifacts such as knife marks, compression, or crevasses. Focused ion beam (FIB), on the other hand, is used extensively to reveal sub-surface information from bulk material, create samples for other analytical modalities, or prepare ultra-thin specimens for analysis in transmission electron microscopy (TEM), without knife-sectioning artifacts.
Moreover, combining the site-specific milling capabilities of FIB with scanning electron microscopy (SEM) opens a broad range of possibilities for preparing biological samples. FIB-SEM systems are widely used for routine preparation of ultra-thin TEM specimens as well as precision cross-sectioning and 3D volume imaging, which are possible in both ambient temperatures and cryogenic conditions.
In this seminar, we will demonstrate the feasibility and discuss the potential of TESCAN cryo-FIB-SEM as a reliable tool for cryo-TEM sample preparation, with its exceptional range of additional capabilities—all within a single versatile workstation.
Presenter: Ondrej Sulak
About Ondrej Sulak
Ondrej Sulak received his Master degree from Analytical chemistry at Masaryk University in the Czech Republic. Then, he moved to France where he continued his Ph.D. studies and Postdoctoral research at Joseph Fourier University in Grenoble where he was focused on the structure-functional characterization of carbohydrate-binding proteins, mainly by X-ray crystallography, Electron Microscopy, SAXS, and other techniques. His industrial career he started in the biotechnological company where he was responsible for biochemistry department. In 2016, Ondrej joint TESCAN as Global Applications Director. Since January 2019 he works as Product Marketing Director for Life Sciences segment.