Feature size and its potential to deviate from expectation, materials composition, and the relationship between small scale and large scale — these are common questions that can be resolved by SEM microanalysis.
Samples may vary in type, size, and shape, as well as in their individual preparation methods, therefore, an SEM workflow is the best choice for obtaining characterization data. The most common SEM workflow consists of three steps: navigation, sample contrast exploration (SE/BSE), and elemental inspection (EDS). The degree to which this workflow can be effortlessly and efficiently applied to the wide range of samples coming to the laboratory—while also maintaining the highest possible resolution and image quality—is one of the many key factors which define the productivity and success of materials research and development projects.
At their market introduction, TESCAN´s VEGA and MIRA SEMs were designed to allow users performing this common workflow to do so intuitively and efficiently. In this webinar, we will show how new features on TESCAN’s 4th Generation VEGA and the FEG-SEM MIRA make a conventional analytical workflow more intuitive to perform as well as more efficient, so all users, even those new to SEM, can obtain comprehensive data.
Presenter: Petr Klimek
About Petr Klimek
Petr Klímek is a Product Manager for TESCAN SEMs at the TESCAN in Brno, Czech Republic. He has 5 years of experience with SEMs and their application to routine microanalytical tasks. He obtained his Ph.D. in Materials Sciences at Mendel University in Brno and extended his materials research background through his internships at Fraunhofer WKI and Oregon State University (Fulbright Scholar).