TESCAN Webinar:

TESCAN Plasma FIB-SEM for multi-modal materials characterization

On demand


Recent developments of new materials and manufacturing technologies are imposing new requirements for materials characterization. Acquiring complete information about material microstructure and its relation to mechanical or physical properties often requires a multi-scale characterization approach involving multiple analytical techniques.

In this webinar you will learn about:

Please join use to learn about FIB-SEM multi-scale characterization capabilities in the video below.

EBSD map of a 90 µm diameter cold-drawn copper wire

Presenter: Dean Miller PhD 


About Dean Miller PhD 

Principal Scientist. Dean Miller received his B.S. in Metallurgical Engineering and Ph.D. in Materials Science, both from the University of Illinois in Champaign-Urbana. He was a Senior Materials Scientist at Argonne National Laboratory for 30 years, including serving as Director for the Electron Microscopy Center at Argonne. His research focuses on the characterization of complex electronic oxides including advanced battery materials, magnetic oxides, and high-temperature superconductors with a particular emphasis on characterization by electron beam methods.