of Tescan instruments
Scanning Electron Microscopes (SEM)
Tescan’s SEM platforms provide high-resolution imaging and surface analysis with exceptional contrast, detail, and ease of use—ideal for materials research, quality control, and analytical applications.
Focused Ion Beam-Scanning Electron Microscopes (FIB-SEM)
Tescan FIB-SEM systems combine fast, precise milling with high-resolution imaging and advanced automation. Choose from Ga or Xe plasma FIB sources to match your needs in sample prep, prototyping, or failure analysis.
Micro-computed tomography (microCT)
Tescan’s X-ray micro-CT systems deliver fast, high-resolution 3D and 4D imaging for non-destructive internal analysis. Dynamic in-situ capabilities and modular designs make them ideal for advanced research across materials, life sciences, and energy storage.
4D STEM
Tescan's TENSOR is the first 4D-STEM platform built for intuitive multimodal nanocharacterization, combining structural, morphological, and chemical insights in every scan. Real-time data processing, automation, and scripting support make it ideal for both routine and advanced research.
Decades of Progress, Just Getting Started
Since 1991, Tescan systems have been designed to feel seamless, intuitive, and built for real research. Think of us as reducing the coefficient of friction between question and discovery.
Explore the tool that helps you get answers
Tescan instruments are built to solve your research challenges - fast. Let’s find the right solution together.
Let’s find the right fit for your research
Talk to a Tescan expert about your goals - we’ll help you pinpoint the system and workflow that move your work forward.
