WEBINAR | From Infrastructure to Impact: EM & Micro-CT in Materials Core Facilities

Accelerating the Art
of Discovery

Discover Laser Solutions
FemtoChisel for high-precision semiconductor sample prep
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Tescan Solutions

materialscience

Explore Materials Science at Micro and Nano Scale with Precision

Analyze structure, defects and interfaces using FIB-SEM, STEM and micro-CT systems built to support every stage from R&D to production. Use these tools to ensure consistency throughout your workflow.

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Advance Semiconductor Failure Analysis with Confidence

Ensure device integrity and consistent results throughout various analysis phases. Our solutions support precise delayering, TEM lamella preparation, non-destructive 3D imaging, and package-level cross-sectioning. They help isolate faults, validate advanced packaging, and identify root causes reliably. Automated workflows and precise endpointing provide clarity and uniformity, helping you make quicker decisions and improve device performance.

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Advance Battery Research and Production with Confidence

Deliver reliable insights throughout the energy storage lifecycle, from raw material optimization to cell design and recycling. Our comprehensive workflows integrate high-resolution imaging, multimodal analysis, and non-destructive 3D visualization to uncover particle morphology, electrode interfaces, and failure mechanisms, all while maintaining sample integrity. Automated workflows deliver reproducible data that improve quality assurance, accelerate innovation, and promote sustainability in advanced battery technologies.

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Explore Life Sciences at Native State with Confidence

Preserve cellular and tissue structures with cryogenic FIB-SEM workflows for precise biological analysis. Covering cryo-ET sample prep, surface morphology, and 3D volume reconstruction, our tools assist multiple phases of life science research. Consistent cryogenic conditions, automated milling, and accurate imaging preserve structural integrity, providing reproducible, high-resolution data for better biological system insights.

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Explore Geoscience in 2D and 3D with Clarity

Advance geoscience research with integrated imaging and analysis solutions built for the complexity of natural materials. Tescan Micro-CT systems reveal 3D pore networks, textures, and fossils structures with exceptional resolution, while SEM-based mineralogical analysis quantifies mineralphases, grain relationships, and chemical composition. From petrology and paleontology to reservoir evaluation, CO2 and H2 storage, and mineral processing, these complementary techniques deliver reproducible, quantitative insights that link microstructure to behavior – empowering confident, data-driven interpretations across the geosciences.

materialscience

Explore Materials Science at Micro and Nano Scale with Precision

Analyze structure, defects and interfaces using FIB-SEM, STEM and micro-CT systems built to support every stage from R&D to production. Use these tools to ensure consistency throughout your workflow.

semiconductors (2)

Advance Semiconductor Failure Analysis with Confidence

Ensure device integrity and consistent results throughout various analysis phases. Our solutions support precise delayering, TEM lamella preparation, non-destructive 3D imaging, and package-level cross-sectioning. They help isolate faults, validate advanced packaging, and identify root causes reliably. Automated workflows and precise endpointing provide clarity and uniformity, helping you make quicker decisions and improve device performance.

Frame 722 (1) (1)

Advance Battery Research and Production with Confidence

Deliver reliable insights throughout the energy storage lifecycle, from raw material optimization to cell design and recycling. Our comprehensive workflows integrate high-resolution imaging, multimodal analysis, and non-destructive 3D visualization to uncover particle morphology, electrode interfaces, and failure mechanisms, all while maintaining sample integrity. Automated workflows deliver reproducible data that improve quality assurance, accelerate innovation, and promote sustainability in advanced battery technologies.

Frame 722 (3)

Explore Life Sciences at Native State with Confidence

Preserve cellular and tissue structures with cryogenic FIB-SEM workflows for precise biological analysis. Covering cryo-ET sample prep, surface morphology, and 3D volume reconstruction, our tools assist multiple phases of life science research. Consistent cryogenic conditions, automated milling, and accurate imaging preserve structural integrity, providing reproducible, high-resolution data for better biological system insights.

Frame 722 (2) (1)

Explore Geoscience in 2D and 3D with Clarity

Advance geoscience research with integrated imaging and analysis solutions built for the complexity of natural materials. Tescan Micro-CT systems reveal 3D pore networks, textures, and fossils structures with exceptional resolution, while SEM-based mineralogical analysis quantifies mineralphases, grain relationships, and chemical composition. From petrology and paleontology to reservoir evaluation, CO2 and H2 storage, and mineral processing, these complementary techniques deliver reproducible, quantitative insights that link microstructure to behavior – empowering confident, data-driven interpretations across the geosciences.

Accelerating science

NEWS

Micro-CT & Plasma FIB-SEM for Multiscale Characterization

Discover how integrating micro-CT and plasma FIB-SEM enables multiscale 3D characterization of heterogeneous materials, linking structure, chemistry, and performance.

NEWS

How to Reduce EBL Stitching on a Standard SEM

Learn how to reduce EBL stitching errors on a standard SEM using technological layers and smart write-field placement in a GDSII workflow.

NEWS

Lamella Preparation with Precise Thickness Estimation for TEM

Learn practical methods to estimate lamella thickness for TEM, including FIB-SEM transparency, EELS-based measurement, and X-mark polishing techniques.

NEWS

Riley Tejcek Interview: Performance, Safety & X-ray CT

An interview with Riley Tejcek on performance and safety, including how non-destructive X-ray CT supports materials inspection in demanding environments.

Discover the power

of Tescan instruments
MIRA XR GM MONO Metal

Scanning Electron Microscopes (SEM)

Tescan’s SEM platforms provide high-resolution imaging and surface analysis with exceptional contrast, detail, and ease of use—ideal for materials research, quality control, and analytical applications.

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Focused Ion Beam-Scanning Electron Microscopes (FIB-SEM)

Tescan FIB-SEM systems combine fast, precise milling with high-resolution imaging and advanced automation. Choose from Ga or Xe plasma FIB sources to match your needs in sample prep, prototyping, or failure analysis.

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Micro-computed tomography (microCT)

Tescan’s X-ray micro-CT systems deliver fast, high-resolution 3D and 4D imaging for non-destructive internal analysis. Dynamic in-situ capabilities and modular designs make them ideal for advanced research across materials, life sciences, and energy storage.

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4D STEM

Tescan's TENSOR is the first 4D-STEM platform built for intuitive multimodal nanocharacterization, combining structural, morphological, and chemical insights in every scan. Real-time data processing, automation, and scripting support make it ideal for both routine and advanced research.

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Laser solutions

FemtoChisel is the next-generation femtosecond laser solution built specifically for semiconductor sample preparation and failure analysis. For too long, the industry has had to compromise between throughput, precision, and Surface Quality. Now all are delivered on one integrated platform.  

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Ex Situ Lift-Out Solutions

Tescan EXLO is designed for laboratories where TEM throughput, reproducibility, and cost efficiency matter. By moving specimen lift-out outside the FIB-SEM, EXLO keeps valuable beam time focused on milling, while parallelizing lamella transfer and grid mounting. The result: higher output, lower cost per specimen, and a more efficient workflow.

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Ion Implantation and UHV FIB-SEM Solutions

Tescan’s advanced systems support operation under demanding conditions-from controlled ion implantation to analytical tasks performed in ultra-high vacuum environments-while offering the freedom to customize system configuration and workflows to your specific research needs. 

About Tescan

Decades of Progress, Just Getting Started

Since 1991, Tescan systems have been designed to feel seamless, intuitive, and built for real research. Think of us as reducing the coefficient of friction between question and discovery.

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GET IN Touch

Contact us

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Where can 
you find us:

Tescan
Libušina třída 21
623 00 Brno
Czech Republic

130405923 us US 37.09024 -95.712891 25.3575 29.349345 20.67957527 42.082797 39.91384763 -33.693421 13.93320106 3.039986586 31.997988 38.050985 47.579533 48.1485965 58.375799 54.663142 19.195447 56.975106 50.493053 45.868592 10.79556993 44.35660598 43.2371604 55.536415 14.557577179752773 32.100937 -6.116829 -6.212299277967318 23.7104 -33.471062 31.998740087 -23.69149395 43.462349 51.529848 49.1893523 49.197486 25.072375 31.075811 1.299027 40.676979 52.30150662 51.013813 35.684121 37.479653 52.246622 40.581349 39.911632 -26.1811371 41.818215 33.429928 -12.08688

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