TESCAN LYRA3
When compared to their coarse-grained alternatives, ultra-fine grained and nanocrystalline materials demonstrate enhanced strain rate sensitivity (SRS). The goal of this present study is to expand the repertoire of nanomechanical testing methods for SRS measurements through the design of micropillar strain rate jump tests on nanocrystalline nickel. The micropillars for the studies conducted in this work were prepared using a TESCAN LYRA3 gallium focused ion beam scanning electron microscope.
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