Morphological characterization of nanostructures with the TESCAN MIRA3 FEG-SEM

A well-defined characterization of size and distribution of nanoparticles is crucial for industrial control quality as well as for research and development activities. The TESCAN MIRA3 Field Emission Scanning Electron Microscope offers excellent performance and resolution that are essential for routine morphological characterization of nanoparticles that are common in a wide range of application fields.

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