TESCAN’s fully integrated backscattered electron detectors

Selecting the right BSE detector for characterizing your samples

Electron microscopists have multiple techniques at their disposal for determining a sample’s composition. Sample composition can be characterized initially using Backscattered Electron (BSE) imaging. However, as the diversity in analyzed specimens grows, different BSE methods are required to properly describe phases of the investigated specimens. For this reason, it is crucial to select the appropriate BSE detector for the kind of information you need to collect from your sample. 

  • Characterize material contrast at analytical conditions with the Retractable Backscattered Electron Detector (RBSE)
  • Characterize material contrast at low landing energies with the Low Energy Retractable Backscattered Electron Detector (LE RBSE) 
  • Characterize material contrast and complementary topography simultaneously with the Low Energy Four Quadrant Backscattered Electron Detector (LE 4QBSE) 
  • Characterize material contrast without bright phases originating from CL emissive samples using the Aluminum Coated Backscattered Electron Detector (Al coated RBSE) 
  • Specify materials contrast phases at elevated temperatures with the Water Cooled Retractable Backscattered Electron Detector (Water Cooled BSE)
Fig.1. Cast Ti alloys, are often used for hip-joint replacements or light-weight structures. Phase analysis after casting is always required to ascertain the quality of castings. BSE detection reveals HCP (dark) and FCC (bright) phases forming a feather-like microstructure.
Fig.2. ECCI of deformed non-magnetic stainless steel, austenite grain with deformation twins, and dislocation ensembles. Strain hardening response and microstructural development under plastic strain can be visualized in greater detail using BSE. Results can be correlated to EBSD.
Fig.3. Phase image of a mixed powder that contains a mineral phase. This powder is used for powder coating so identification of different phases is critical for determining properties.
Fig.4. Necked region of the Inconel 718 alloy displayed at 700° C using water cooled BSE detector.
Fig.5. Ceramic powder. The overall morphology and composition of particles are being investigated.
Fig.6. Image of a solder bump interface where uniformity and the presence of defects such as cracks and voids are studied. Imaged in low vacuum (MultiVac) mode on a mechanically polished cross section.
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