Electron microscopists have multiple techniques at their disposal for determining a sample’s composition. Sample composition can be characterized initially using Backscattered Electron (BSE) imaging. However, as the diversity in analyzed specimens grows, different BSE methods are required to properly describe phases of the investigated specimens. For this reason, it is crucial to select the appropriate BSE detector for the kind of information you need to collect from your sample.
- Characterize material contrast at analytical conditions with the Retractable Backscattered Electron Detector (RBSE)
- Characterize material contrast at low landing energies with the Low Energy Retractable Backscattered Electron Detector (LE RBSE)
- Characterize material contrast and complementary topography simultaneously with the Low Energy Four Quadrant Backscattered Electron Detector (LE 4QBSE)
- Characterize material contrast without bright phases originating from CL emissive samples using the Aluminum Coated Backscattered Electron Detector (Al coated RBSE)
- Specify materials contrast phases at elevated temperatures with the Water Cooled Retractable Backscattered Electron Detector (Water Cooled BSE)