Focus Ion Beam Scanning Electron Microscopy (FIB-SEM) has become an essential tool for materials science and engineering. TESCAN offers an extended portfolio of turnkey systems, tailored to help scientists and researchers in materials science make progress and achieve their goals. TESCAN’s broad range of dedicated and innovative instruments is part of our firm commitment to push materials science forward.
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A unique combination of Plasma FIB and field-free UHR FE-SEM for multiscale materials characterizationMore information