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TESCAN FIB-SEM Solutions for Materials Science

Focus Ion Beam Scanning Electron Microscopy (FIB-SEM) has become an essential tool for materials science and engineering. TESCAN offers an extended portfolio of turnkey systems, tailored to help scientists and researchers in materials science make progress and achieve their goals. TESCAN’s broad range of dedicated and innovative instruments is part of our firm commitment to push materials science forward.

TESCAN FIB-SEM Solutions for Materials Science

TESCAN AMBER X

A unique combination of Plasma FIB and field-free UHR FE-SEM for multiscale materials characterization

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TESCAN AMBER

Versatile nanoanalytical FIB-SEM to expand your materials research capabilities

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TESCAN SOLARIS

Advanced nanofabrication workbench for your research lab

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Do you wish to discuss TESCAN FIB-SEM Solutions for Materials Science? Contact our Product Team directly!