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TESCAN SOLARIS X: Rocking stage for high-quality polishing of cross section surfaces
11. 03. 2020
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TESCAN SOLARIS X: Rocking stage for high-quality polishing of cross section surfaces
Principle of the rocking stage, which allows SEM observation during FIB…
11. 03. 2020
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TESCAN SOLARIS X: Physical Failure Analysis of a MEMS Motion Sensor
Creating 1 mm-wide cross-sections with TESCAN SOLARIS X
05. 03. 2020
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TESCAN UniTOM XL: 3D micro-CT analysis of a sheep femur
A powerful workflow combining acquisition, visualization and analysis of bone.
13. 01. 2020
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SEM and EBSD analysis of the grain structure after ECAP process of the aluminum material
The new TESCAN CLARA, a field-free analytical UHR-SEM for nanoscale materials characterization, brings improved potential…
19. 09. 2019
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TESCAN AMBER X | New Plasma FIB Field-Free UHR FE-SEM
A unique combination of plasma FIB and field-free UHR FE-SEM for the widest range of…
02. 09. 2019
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Analysis of ceramic nano-particles
The new TESCAN CLARA field-free Ultra-High Resolution Scanning Electron Microscope (UHR-SEM) equipped by Brightbeam™ technology…
21. 08. 2019
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Advanced BSE detection capabilities of the TESCAN CLARA UHR-SEM
The BSE (Back Scattered Electron) image contrast differs depending on both the take-off angle and…
07. 08. 2019
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TESCAN CLARA | New Field-Free UHR SEM
TESCAN proudly presents the TESCAN CLARA field-emission scanning electron microscope to the materials science community…
06. 08. 2019
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