Uncompromised characterization of all types of materials at the nanoscale
Ideal for characterization of materials at low beam energies for maximum surface topography
Excellent imaging of beam-sensitive and non-conductive samples
Fully automated setup of electron beam – optimal imaging conditions are guaranteed by the In-Flight Beam Tracing™
Intuitive live SEM navigation on the sample at magnification as low as 2× without the need of extra optical navigation camera thanks to the Wide Field Optics™ design
Unique In-Beam Multidetector design allowing angle and energy selective BSE detection
Intuitive software modular platform designed for effortless operation regardless users’ skill level
